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Spectrum Analyzer
Leading in speed, dynamic range and ease of operation.
- Features
- More than 60 years of experience in the field of vector network analysis pay off: Rohde & Schwarz sets new benchmarks with its R&S®ZNB family of vector network analyzers. These analyzers feature high measurement speed, outstanding precision and exceptional ease of operation.
* Frequency range from 9 kHz up to 40 GHz
* Wide dynamic range of up to 140 dB
* Short sweep times, e.g. 4 ms for 401 points
* High temperature stability of typ. 0.01 dB/°C
* Wide power sweep range of 98 dB
* Wide range of IF bandwidths from 1 Hz to 10 MHz
* Manual and automatic calibration
* Large, high-resolution 12.1" screen
* Touchscreen user interface
* Two or four ports
* Four-port model with two independant generators
* Expansion to up to 48 ports using switch matrices
- Safety/Quality Approvals
- * Designed to meet the highest standards
-Wide dynamic range from 9 kHz for fast measurements on high-blocking DUTs
-Excellent raw data for high basic accuracy
-High temperature stability for long calibration intervals
-Fast synthesizers for high measurement speed
-R&S®ZNB40 two-port model available in two versions
* Convenient characterization of active and passive RF components
-Fast embedding/de-embedding for impedance matching using virtual networks
-Mixed-mode S-parameters for balanced DUT characterization
-Redefined S-parameters for flexible test setup configuration
-Extensive analysis functions for efficient trace analysis
-Amplifier measurements with wide power sweep range and receiver step attenuators
-Time domain analysis for distance-to-fault (DTF) measurements and filter adjustment
-Frequency conversion measurements on mixers and amplifiers – fast and simple with two independent internal generators
* Simple calibration – manual or automatic
-The right calibration method for every test application
-TSM (Through, Short, Match) – full calibration in only five steps
-Automatic calibration units with up to 24 ports
* Network analysis made easy
-Flat and clear menu structures for efficient operation
-Optimal display configuration for each measurement task
* High throughput in production
-Short measurement times
-High measurement speed due to wide dynamic range and optimized IF bandwidths
-Segmented sweep tailored to device under test
-Fast switching between instrument setups
-Handler I/O interface for control of external parts handlers
-GPIB interface with bidirectional data transfer saves time in production
* Measurements with up to 48 ports
-Expanding the number of ports with switch matrices
-RFFE GPIO interface for direct control of frontend modules
-Easy configuration at the push of a button
-Fast measurements and excellent RF characteristics
-Matrix solutions for every application
* A worthwhile investment
-Ready for the future
-Upgrading test systems without rewriting system software
-An analyzer that speaks the user's language
